Browsing by Author "Zhang, Jianfu"
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Publication Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations
Proceedings paper2011, IEEE International Electron Devices Meeting - IEDM, 5/12/2011, p.219-222Publication Evaluation and solutions for P/E window instability induced by electron trapping in high-k inter-gate dielectrics of flash memory cells
Journal article2014, IEEE Transactions on Electron Devices, (61) 5, p.1299-1306Publication Experimental evidence toward understanding charge pumping signals in 3-D devices with Poly-Si channel
Journal article2014, IEEE Transactions on Electron Devices, (61) 5, p.1501-1507Publication Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Journal article2014, Microelectronics Reliability, (54) 9_10, p.2258-2261