Browsing by Author "Zhang, Z."
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Publication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
;Zhou, L. ;Zhang, Q. ;Yang, H. ;Ji, Z. ;Zhang, Z. ;Liu, Q. ;Xu, H. ;Tang, B.; ;Ma, X.Wang, X.Journal article2020, IEEE Electron Device Letters, (41) 7, p.965-968