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Browsing by Author "Zheng, X. F."

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    A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications

    Zheng, X. F.
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    Zhang, W. .D
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    Govoreanu, Bogdan  
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    Zhang, J. F.
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    Van Houdt, Jan  
    Proceedings paper
    2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.139-142
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    Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction

    Meng, D.
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    Zhang, J. F.
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    Zhang, J. C.
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    Zhang, W.
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    Ji, Z.
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    Benbakhti, B.
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    Zheng, X. F.
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    Hao, Y.
    ;
    Vigar, D.
    Proceedings paper
    2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-5.1-XT-5.7

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