Browsing by Author "Zheng, X. F."
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Publication A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications
Proceedings paper2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.139-142Publication Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
;Meng, D. ;Zhang, J. F. ;Zhang, J. C. ;Zhang, W. ;Ji, Z. ;Benbakhti, B. ;Zheng, X. F. ;Hao, Y.Vigar, D.Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.XT-5.1-XT-5.7