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Browsing by Author "Zimmerman, J."

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    Freeform illumination sources: an experimental study of source-mask optimization for 22nm SRAM cells

    Bekaert, Joost  
    ;
    Laenens, Bart
    ;
    Verhaegen, Staf
    ;
    Van Look, Lieve  
    ;
    Trivkovic, Darko  
    Proceedings paper
    2010, Optical Microlithography XXIII, 21/02/2010, p.764008
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    Impact of an etched EUV mask black border on imaging and overlay

    Davydova, N.
    ;
    de kruif, R.
    ;
    Fukugami, N.
    ;
    Kondo, S.
    ;
    Philipsen, Vicky  
    ;
    Van Setten, E.
    ;
    Connolly, B.
    Proceedings paper
    2012, Photomask Technology, 10/09/2012, p.852206

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