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Browsing by Author "van Neer, P. L. M. J."

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    Feasibility of detecting and imaging deeply buried voids using GHz Half Wavelength Contact Acoustic Microscopy

    Quesson, Benoit A. J.
    ;
    van Willigen, D. M.
    ;
    Horchens, L.
    ;
    Gerritsmal, A. M.
    ;
    Bogdanowicz, Janusz  
    Proceedings paper
    2024, 2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium, 2024-26-22
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    Suitability of Half-Wavelength Contact Acoustic Microscopy to detect deeply buried voids

    van Neer, P. L. M. J.
    ;
    van Willigen, D. M.
    ;
    Horchens, L.
    ;
    Gerritsma, A. M.
    ;
    Bogdanowicz, Janusz  
    Proceedings paper
    2025, 2025 Conference on Metrology Inspection and Process Control-Annual, 2025-02-24, p.134261M-1-134261M-4

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