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Browsing by Author "van der Meijs, N.P."

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    Efficient sensitivity-based capacitance modeling for systematic and random geometric variations

    Yu, Bi
    ;
    Harpe, Pieter
    ;
    van der Meijs, N.P.
    Proceedings paper
    2011, 16th Asia and Sout Pacific Design Automation Conference - ASP-DAC, 25/01/2011, p.61-66

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