Browsing by author "Collins, Tom"

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Improved hot-carrier reliability in a 0.5-µm TLM CMOS process by back-end process optimization

Van den Bosch, Geert; Deferm, Ludo; Forester, Lynn; Collins, Tom (1994)
Interlevel dielectric engineering for improved device performance in half-micron CMOS

Forester, Lynn; Collins, Tom; Van den Bosch, Geert; Meynen, Herman; Coenegrachts, Bart; Van den hove, Luc (1994)