Browsing by author "Alles, Michael"

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Radiation effects in advanced multiple-gate and silicon-on-insulator transistors

Simoen, Eddy; Gaillardin, Marc; Paillet, Philippe; Reed, Robert; Schrimpf, Ron; Alles, Michael; El-Mamouni, Farah; Fleetwood, Daniel; Griffoni, Alessio; Claeys, Cor (2013)
Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

Mitard, Jerome; Zhang, En Xia; Fleetwood, Daniel; Hachtel, Jordan; Liang, Chundong; Reed, Robert; Alles, Michael; Schrimpf, Ronald; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Chisholm, Matthew; Pantelides, Sokrates (2016-07)