Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

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Authors
Mitard, Jerome; Zhang, En Xia; Fleetwood, Daniel; Hachtel, Jordan; Liang, Chundong; Reed, Robert; Alles, Michael; Schrimpf, Ronald; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Thean, Aaron; Chisholm, Matthew; Pantelides, Sokrates
Conference
IEEE Nuclear Space and Radiation Conference - NSREC
Title
Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si
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