Publication:
Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si
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1980 since deposited on 2021-10-23
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Acq. date: 2026-03-17
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Statistics
Views
1980 since deposited on 2021-10-23
3last month
1last week
Acq. date: 2026-03-17
Citations