Publication:

Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

Date

2016-07

Meeting abstract

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Author(s)

;

;

Fleetwood, Daniel

;

Hachtel, Jordan

;

Liang, Chundong

;

;

;

Schrimpf, Ronald

;

Linten, Dimitri

;

Witters, Liesbeth

;

Collaert, Nadine

;

;

Chisholm, Matthew

;

Pantelides, Sokrates

Statistics

1980 since deposited on 2021-10-23

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Acq. date: 2026-04-05