Browsing by author "Cheung, K. P."
Now showing items 1-4 of 4
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Quantitative yield and reliability projection from antenna test results - A case study
Mason, P. W.; Cheung, K. P.; Hwang, D. K.; Creusen, Martin; Degraeve, Robin; Kaczer, Ben (2000) -
Stress-induced leakage current (SILC) and oxide breakdown: are they from the same oxide traps?
Pantisano, Luigi; Cheung, K. P. (2001) -
The impact of plasma-charging damage on the RF performance of deep-submicron MOSFET
Pantisano, Luigi; Cheung, K. P.; Roussel, Philippe; Paccagnella, A. (2002) -
The impact of post breakdown gate leakage on MOSFET RF performance
Pantisano, Luigi; Cheung, K. P. (2001)