Browsing by author "Fernandez, Raul"
Now showing items 1-3 of 3
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Experimental characterization of NBTI effect on pMOSFET and CMOS inverter
Fernandez, Raul; Kaczer, Ben; Gago, J.; Rodriguez, Rosana; Nafria, Montserrat (2009-02) -
Proof-of-concept structure for investigation of successive soft gate oxide breakdowns in two dimensions
Kaczer, Ben; Fernandez, Raul; Nackaerts, Axel; Chiarella, Thomas; Groeseneken, Guido (2007-07) -
Toward understanding the wide distribution of time scales in negative bias temperature instability
Kaczer, Ben; Grasser, Tibor; Fernandez, Raul; Groeseneken, Guido (2007)