Authors

Kaczer, Ben; Fernandez, Raul; Nackaerts, Axel; Chiarella, Thomas; Groeseneken, Guido

Conference

14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA

Title

Proof-of-concept structure for investigation of successive soft gate oxide breakdowns in two dimensions

Publication type

Proceedings paper

Embargo date

9999-12-31