Browsing by author "Hruska, P."
Now showing items 1-5 of 5
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High frequency RTS noise in submicron MOSFETs
Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy; Matulionis, A.; Stadalnikas, A.; Palenskis, V. (1996) -
Noise and THI reliability indicators for thin film resistors
Sikula, J.; Hruska, P.; Vasina, Petr; Schauer, P.; Kolarova, R.; Hajek, K.; Stadalnikas, A.; Palenskis, V.; Claeys, Cor; Simoen, Eddy (1996) -
RTS noise in submicron MOSFETs
Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, C.; Simoen, Eddy; Stadalnikas, A. (1996) -
Transition intensities and noise spectra in submicron MOSFETs
Härtler, G.; Golze, U.; Sikula, J.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy (1997) -
Transition probabilities and noise spectra in submicron MOSFETs
Haertler, C.; Golze, U.; Sikula, J.; Sikulova, M.; Hruska, P.; Vasina, Petr; Claeys, Cor; Simoen, Eddy (1996)