Noise and THI reliability indicators for thin film resistors

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Authors
Sikula, J.; Hruska, P.; Vasina, Petr; Schauer, P.; Kolarova, R.; Hajek, K.; Stadalnikas, A.; Palenskis, V.; Claeys, Cor; Simoen, Eddy
Conference
Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium
Title
Noise and THI reliability indicators for thin film resistors
Publication type
Proceedings paper
Embargo date
9999-12-31
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