Publication:

Noise and THI reliability indicators for thin film resistors

Date

1996
Proceedings Paper
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dc.contributor.authorSikula, J.
dc.contributor.authorHruska, P.
dc.contributor.authorVasina, Petr
dc.contributor.authorSchauer, P.
dc.contributor.authorKolarova, R.
dc.contributor.authorHajek, K.
dc.contributor.authorStadalnikas, A.
dc.contributor.authorPalenskis, V.
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T15:24:47Z
dc.date.available2021-09-29T15:24:47Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1479
dc.source.beginpage200
dc.source.conferenceProceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium
dc.source.conferencedate7/10/1996
dc.source.conferencelocationNice France
dc.source.endpage205
dc.title

Noise and THI reliability indicators for thin film resistors

dc.typeProceedings paper
dspace.entity.typePublication
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