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Conference contributions
Noise and THI reliability indicators for thin film resistors
Publication:
Noise and THI reliability indicators for thin film resistors
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Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Schauer, P.
;
Kolarova, R.
;
Hajek, K.
;
Stadalnikas, A.
;
Palenskis, V.
;
Claeys, Cor
;
Simoen, Eddy
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1961
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-11
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Metrics
Views
1961
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-11
Citations