Browsing by author "Nakaie, T."
Now showing items 1-3 of 3
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ESD on-wafer characterization: Is TLP still the right measurement tool?
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep; Sawada, Masanori; Nakaie, T.; Hasebe, Takumi; Groeseneken, Guido (2009-10) -
Low-power low-noise highly ESD robust LNA and VCO design using above IC inductors
Linten, Dimitri; Sun, Xiao; Thijs, Steven; Mahadeva Iyer, Natarajan; Mercha, Abdelkarim; Carchon, Geert; Wambacq, Piet; Nakaie, T.; Decoutere, Stefaan (2005-09) -
RF ESD protection strategies - the design and performance trade-off challenges
Jansen, Philippe; Thijs, Steven; Linten, Dimitri; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Liu, Mingxu; Concannon, A.; Tremouilles, David; Nakaie, T.; Sawada, M.; Vashchenko, V.; ter Beek, M.; Hasebe, T.; Decoutere, Stefaan; Groeseneken, Guido (2005-09)