Browsing by author "Dixon-Luinenburg, Oberon"

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Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP

Dixon-Luinenburg, Oberon; Celano, Umberto; Vandervorst, Wilfried; Paredis, Kristof (2019)
Individual device analysis using hybrid TEM-scalpel SSRM metrology

Celano, Umberto; Favia, Paola; Drijbooms, Chris; Dixon-Luinenburg, Oberon; Richard, Olivier; Bender, Hugo; Vancoille, Eric; Paredis, Kristof; Loo, Roger; Schulze, Andreas; Hikavyy, Andriy; Witters, Liesbeth; Mitard, Jerome; Collaert, Nadine; Horiguchi, Naoto; Vandervorst, Wilfried (2017)