Browsing by author "Blachier, D."

Now showing items 1-1 of 1

Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin (2002)