Browsing by author "Boehme, Thijs"
Now showing items 1-5 of 5
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Hedgehog probe tips enabling high-resolution scanning probe microscopy
Boehme, Thijs; Hantschel, Thomas; Wouters, Lennaert; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried (2019) -
Laser-Induced Periodic Surface Structures (LIPSS) on heavily boron-doped diamond for electrode applications
Sartori, André F.; Hantschel, Thomas; Orlando, Stefano; Bellucci, Alessandro; Trucchi, Daniele M.; Abrahami, Shoshan; Boehme, Thijs; Vandervorst, Wilfried; Buijnsters, Josephus G. (2018) -
Reverse tip sample scanning for precise and high-throughput electrical characterization of advanced nodes
Celano, Umberto; Hantschel, Thomas; Boehme, Thijs; Kanniainen, A.; Wouters, Lennaert; Bender, Hugo; Bosman, Niels; Drijbooms, Chris; Folkersma, Steven; Paredis, Kristof; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Self-patterned ultra-sharp diamond tips and their application for advanced nanoelectronics device characterization by electrical SPM
Wouters, Lennaert; Boehme, Thijs; Mana, Luca; Hantschel, Thomas (2023) -
Transient behaviour in colloidal nanodiamond seeding
Hantschel, Thomas; Calzolaro, Anthony; Boehme, Thijs; Vereecken, Philippe; Vandervorst, Wilfried (2017)