Browsing by author "Demeulemeester, Cindy"
Now showing items 1-6 of 6
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Backside analysis of ultra-thin film stacks in microelectronics technology using X-ray photoelectron spectroscopy
Hantschel, Thomas; Demeulemeester, Cindy; Suderie, Arnaud; Lacave, Thomas; Conard, Thierry; Vandervorst, Wilfried (2009) -
Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures
Hantschel, Thomas; Demeulemeester, Cindy; Eyben, Pierre; Schulz, Volker; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009) -
Microfabricated diamond tip for nanoprobing
Arstila, Kai; Hantschel, Thomas; Demeulemeester, Cindy; Moussa, Alain; Vandervorst, Wilfried (2009) -
Optical force measurement system with mirror probe for nanoprobing inside a scanning electron microscope
Arstila, Kai; Hantschel, Thomas; Kleindiek, Stephan; Sterr, Jochen; Vaquette, Quentin; Demeulemeester, Cindy; Vandervorst, Wilfried (2009) -
Optical force measurement system with mirror probe for nanoprobing inside a scanning electron microscope
Arstila, Kai; Hantschel, Thomas; Kleindiek, Stephan; Sterr, Jochen; Vaquette, Quentin; Demeulemeester, Cindy; Vandervorst, Wilfried (2010) -
Substrate transfer for GaN-LED on Si (111) 4 inch
Pham, Nga; Rosmeulen, Maarten; Demeulemeester, Cindy; Motsnyi, Vasyl; Sabuncuoglu Tezcan, Deniz; Osman, Haris (2011)