Browsing by author "Schryvers, Dominique"
Now showing items 1-8 of 8
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Characterization of nickel silicides using EELS-based methods
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Characterization of nickel-silicides by HAADF-STEM imaging
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)
Verleysen, Eveline; Richard, Olivier; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2008-09) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Chemical analysis of nickel silicides with high spatial resolution by combined EDS, EELS and ELNES
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2009) -
Compositional characterization of nickel silicides by HAADF-STEM imaging
Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried (2010) -
Damage in nickel silicides during FIB specimen preparation
Verleysen, Eveline; Bender, Hugo; Favia, Paola; Schryvers, Dominique; Vandervorst, Wilfried (2011) -
Experimental determination of inelastic mean free paths for calculation of TEM specimen thickness
Verleysen, Eveline; Bender, Hugo; Schryvers, Dominique; Vandervorst, Wilfried (2011)