Publication:

Characterization of nickel silicides using EELS-based methods

Date

2010

Journal article

https://doi.org/10.1111/j.1365-2818.2010.03391.x

Simple item page Full metadata Statistics

Author(s)

Verleysen, Eveline

;

;

Richard, Olivier

;

Schryvers, Dominique

;

Vandervorst, Wilfried

Journal

Journal of Microscopy

Statistics

1865 since deposited on 2021-10-18

2last month

Acq. date: 2026-04-08