Characterization of nickel silicides using EELS-based methods

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Authors

Verleysen, Eveline; Bender, Hugo; Richard, Olivier; Schryvers, Dominique; Vandervorst, Wilfried

DOI

10.1111/j.1365-2818.2010.03391.x

ISSN

1365-2818

Issue

1

Journal

Journal of Microscopy

Volume

240

Title

Characterization of nickel silicides using EELS-based methods

Publication type

Journal article

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