Publication:
Characterization of nickel silicides using EELS-based methods
| dc.contributor.author | Verleysen, Eveline | |
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.author | Richard, Olivier | |
| dc.contributor.author | Schryvers, Dominique | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.contributor.imecauthor | Richard, Olivier | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
| dc.date.accessioned | 2021-10-18T23:50:22Z | |
| dc.date.available | 2021-10-18T23:50:22Z | |
| dc.date.issued | 2010 | |
| dc.identifier.doi | 10.1111/j.1365-2818.2010.03391.x | |
| dc.identifier.issn | 1365-2818 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18279 | |
| dc.source.beginpage | 75 | |
| dc.source.endpage | 82 | |
| dc.source.issue | 1 | |
| dc.source.journal | Journal of Microscopy | |
| dc.source.volume | 240 | |
| dc.title | Characterization of nickel silicides using EELS-based methods | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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