Browsing by author "Johlander, B."
Now showing items 1-4 of 4
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Generation and annealing behaviour of MeV proton and 252Cf irradiation induced deep levels in silicon diodes
Vanhellemont, Jan; Kaniava, Arvydas; Simoen, Eddy; Trauwaert, Marie-Astrid; Claeys, Cor; Johlander, B.; Harboe-Sörensen, R.; Adams, L. (1994) -
High energy particle irradiation effects on the low-frequency noise of Czochralski silicon junction diodes
Simoen, Eddy; Vanhellemont, Jan; Dubuc, Jean-Paul; Claeys, Cor; Ohyama, Hidenori; Johlander, B. (1996) -
On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
Vanhellemont, Jan; Simoen, Eddy; Claeys, Cor; Kaniava, Arvydas; Gaubas, Eugenijus; Bosman, Gijs; Johlander, B.; Adams, L.; Clauws, P. (1994) -
PFDE: A particle detector front-end ASIC
Wouters, Jan; Redant, Steven; Marent, Katrien; Das, Carl; Habinc, S.; Johlander, B.; Sanderson, T. (2000)