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On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
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Authors
Vanhellemont, Jan
;
Simoen, Eddy
;
Claeys, Cor
;
Kaniava, Arvydas
;
Gaubas, Eugenijus
;
Bosman, Gijs
;
Johlander, B.
;
Adams, L.
;
Clauws, P.
Issue
6
Journal
IEEE Transactions on Nuclear Science
Volume
41
Title
On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties
Publication type
Journal article
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