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On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

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dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorKaniava, Arvydas
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorBosman, Gijs
dc.contributor.authorJohlander, B.
dc.contributor.authorAdams, L.
dc.contributor.authorClauws, P.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T12:51:31Z
dc.date.available2021-09-29T12:51:31Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/429
dc.source.beginpage1924
dc.source.endpage1931
dc.source.issue6
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.volume41
dc.title

On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

dc.typeJournal article
dspace.entity.typePublication
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