On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

Publication:

1994

Journal article

Author(s)

Vanhellemont, Jan

;

;

Claeys, Cor

;

Kaniava, Arvydas

;

Gaubas, Eugenijus

;

Bosman, Gijs

;

Johlander, B.

;

Adams, L.

;

Clauws, P.

IEEE Transactions on Nuclear Science

2122 since deposited on 2021-09-29

Acq. date: 2026-02-24