Browsing by author "Pinardi, Kuntjoro"
Now showing items 1-20 of 22
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A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures
Pinardi, Kuntjoro; Jain, Suresh; Willander, M.; Atkinson, A.; Maes, Herman; Van Overstraeten, Roger (1998) -
A review of recent work on stresses and strains in semiconductor heterostructures
Jain, Suresh; Willander, M.; Pinardi, Kuntjoro; Maes, Herman (1997) -
Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
Pinardi, Kuntjoro; Jain, Uma; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M. (1998) -
Depth profiling of strain using micro-Raman measurements
Atkinson, A.; Jain, Suresh; Maes, Herman; Pinardi, Kuntjoro; Willander, M. (2001) -
Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1998) -
Effect of elastic constants on the stresses in stripes and substrates: a 2D FE calculation
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Willander, M. (1998) -
Experimental validation of mechanical stress models by micro-Raman spectroscopy
De Wolf, Ingrid; Pozzat, G.; Pinardi, Kuntjoro; Howard, Dave; Ignat, M.; Jain, Suresh; Maes, Herman (1996) -
Experimental validation of mechanical stress models by micro-Raman spectroscopy
De Wolf, Ingrid; Pozzat, G.; Pinardi, Kuntjoro; Howard, Dave; Ignat, M.; Jain, Suresh; Maes, Herman (1996) -
Finite element calculations to optimize the design of a stressor for strained induced quantum wires and quantum dots in GaAs
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman (1996) -
Measurement of nonuniform stresses in semiconductor films by optical methods
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1997) -
Measurement of nonuniform stresses in semiconductors by the micro-Raman method
Pinardi, Kuntjoro; Jain, Suresh; Maes, Herman; Van Overstraeten, Roger; Willander, M.; Atkinson, A. (1998) -
Measurement of residual stress in thin films by using the optical microprobe
Atkinson, A.; Clarke, D. R.; Jain, Suresh; Pinardi, Kuntjoro; Webb, S. (1998) -
Mechanical and optical properties of selectively grown AlGaN stripes
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Willander, M. (1997) -
Raman spectra of Ge0.11Si0.89 strained quantum wires
Jain, Suresh; Pinardi, Kuntjoro; Maes, Herman; Van Overstraeten, Roger; Atkinson, A.; Willander, M. (1997) -
Stability of dislocations in epitaxially strained semiconductor strained stripe stripe films
Atkinson, A.; Pinardi, Kuntjoro; Jain, Suresh (1996) -
Stability of epitaxially strained semiconductor stripes
Atkinson, A.; Jain, Suresh; Pinardi, Kuntjoro (1996) -
Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology
Jain, Suresh; Maes, Herman; Pinardi, Kuntjoro; De Wolf, Ingrid (1996) -
Stresses in selectively grown III-V semiconductor stripes and buried quantum wire lasers: effect on optical properties
Jain, Suresh; Pinardi, Kuntjoro; Harker, A. H.; Willander, M.; Maes, Herman; Mertens, Robert (1995) -
Stresses in strained GeSi stripes and quantum structures: calculation using the finite element method and determination using micro-Raman and other measurements
Jain, Suresh; Maes, Herman; Pinardi, Kuntjoro (1997) -
Structure of II-VI lattice mismached epilayers used for blue-green lasers for underwater communication
Pinardi, Kuntjoro; Maes, Herman; Jain, Suresh (1998)