Browsing by author "Shluger, A."

Now showing items 1-2 of 2

Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

Grasser, Tibor; Waltl, Michael; Wimmer, Yannick; Goes, Wolfgang; Kosik, R.; Rzepa, Gerhard; Resinger, Hans; Pobegen, Gregor; El-Sayed, A.; Shluger, A.; Kaczer, Ben (2015)
On the volatility of oxide defects: activation, deactivation, and transformation

Grasser, Tibor; Waltl, Michael; Goes, Wolfgang; Wimmer, Yanick; El-Sayed, A.-M.; Shluger, A.; Kaczer, Ben (2015)