Authors

Grasser, Tibor; Waltl, Michael; Wimmer, Yannick; Goes, Wolfgang; Kosik, R.; Rzepa, Gerhard; Resinger, Hans; Pobegen, Gregor; El-Sayed, A.; Shluger, A.; Kaczer, Ben

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

Publication type

Proceedings paper

Embargo date

9999-12-31