Publication:
Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1993 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-01-12
Citations
Metrics
Views
1993 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-01-12
Citations