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Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
Publication:
Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes
Date
2015
Proceedings Paper
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33229.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grasser, Tibor
;
Waltl, Michael
;
Wimmer, Yannick
;
Goes, Wolfgang
;
Kosik, R.
;
Rzepa, Gerhard
;
Resinger, Hans
;
Pobegen, Gregor
;
El-Sayed, A.
;
Shluger, A.
;
Kaczer, Ben
Journal
Abstract
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1988
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations
Metrics
Views
1988
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations