Browsing by author "Yang, Rui"
Now showing items 1-8 of 8
-
Defects and electrical performance of germanium PMOS devices
Eneman, Geert; Simoen, Eddy; Yang, Rui; De Jaeger, Brice; Wang, Gang; Mitard, Jerome; Hellings, Geert; Brunco, David; Loo, Roger; De Meyer, Kristin; Claeys, Cor; Meuris, Marc; Heyns, Marc (2009) -
Defects, junction leakage and electrical performance of Ge pFET devices
Eneman, Geert; Simoen, Eddy; Yang, Rui; De Jaeger, Brice; Wang, Gang; Mitard, Jerome; Hellings, Geert; Brunco, David; Loo, Roger; De Meyer, Kristin; Caymax, Matty; Claeys, Cor; Meuris, Marc; Heyns, Marc (2009) -
Electrical characterization of germanium for advanced devices
Yang, Rui; Simoen, Eddy; Eneman, Geert; Wang, Gang; Claeys, Cor (2008) -
Investigation of fired and non-fired Si-SiNx interface properties by deep-level transient spectroscopy measurements
Gong, Chun; Simoen, Eddy; Yang, Rui; Posthuma, Niels; Van Kerschaver, Emmanuel; Poortmans, Jef; Mertens, Robert (2009) -
Is there an impact of threading dislocations on the characteristics of devices fabricated in strained-Ge substrates?
Simoen, Eddy; Brouwers, Gijs; Yang, Rui; Eneman, Geert; Bargallo Gonzalez, Mireia; Leys, Frederik; De Jaeger, Brice; Mitard, Jerome; Brunco, David; Souriau, Laurent; Cody, Nyles; Thomas, Shawn; Lajaunie, Luc; David, Marie-Laure (2009) -
On the frequency dispersion of the capacitance-voltage behavior of epitaxial Ge on Si p+-n junctions
Yang, Rui; Eneman, Geert; Wang, Gang; Claeys, Cor; Simoen, Eddy (2009) -
P+/N junction leakage in thin selectively grown Ge-in-STI substrates
Eneman, Geert; Yang, Rui; Wang, Gang; De Jaeger, Brice; Loo, Roger; Claeys, Cor; Caymax, Matty; Meuris, Marc; Heyns, Marc; Simoen, Eddy (2010) -
P+/N junction leakage in thin selectively grown germanium-in-STI substrates
Eneman, Geert; Yang, Rui; Wang, Gang; De Jaeger, Brice; Loo, Roger; Claeys, Cor; Meuris, Marc; Heyns, Marc; Simoen, Eddy (2009)