Browsing by author "Guo, W."
Now showing items 1-6 of 6
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High-temperature characterization of advanced strained nMUGFETs
Talmat, Rachida; Put, Sofie; Collaert, Nadine; Mercha, Abdelkarim; Claeys, Cor; Guo, W.; Cretu, B.; Benfdila, A.; Routoure, J.-M.; Carin, R.; Simoen, Eddy (2010) -
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Routoure, J.M.; Guo, W.; Cretu, B.; Lartigau, I.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2008) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Lartigau, I.; Routoure, J.M.; Guo, W.; Cretu, B.; Carin, R.; Mercha, Abdelkarim; Claeys, Cor; Simoen, Eddy (2007) -
Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Guo, W.; Talmat, R.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009) -
Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Simoen, Eddy; Claeys, Cor (2007)