High-temperature characterization of advanced strained nMUGFETs

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Authors
Talmat, Rachida; Put, Sofie; Collaert, Nadine; Mercha, Abdelkarim; Claeys, Cor; Guo, W.; Cretu, B.; Benfdila, A.; Routoure, J.-M.; Carin, R.; Simoen, Eddy
Conference
6th Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI
Title
High-temperature characterization of advanced strained nMUGFETs
Publication type
Proceedings paper
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