Browsing by author "Mouis, M."
Now showing items 1-4 of 4
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DC and low frequency noise characterization of FINFET devices
Bennamane, K.; Boutchacha, T.; Ghibaudo, G.; Mouis, M.; Collaert, Nadine (2009) -
Electrical transport characterization of nano CMOS devices with ultra-thin silicon film
Ghibaudo, G.; Mouis, M.; Pham-Nguyen, L.; Bennamane, K.; Pappas, I.; Cros, A.; Bidal, G.; Fleury, D.; Claverie, A.; Benassayag, G.; Fazzini, P.-F.; Fenouillet-Beranger, C.; Monfray, S.; Boeuf, F.; Cristoloveanu, S.; Skotnicki, T.; Collaert, Nadine (2009) -
Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Tsormpatzoglou, A.; Dimitriadis, C.; Mouis, M.; Ghibaudo, G.; Collaert, Nadine (2009) -
Static and low frequency noise characterization of FinFET devices
Bennamane, K.; Boutchacha, T.; Ghibaudo, G.; Mouis, M.; Collaert, Nadine (2009)