Now showing items 1-2 of 2

    • Characterization of Impact of Vertical Stress on FinFETs 

      Furuhashi, Takahisa; Haneda, Masaki; Sasaki, Toru; Kagawa, Yoshihisa; Ooka, Yutaka; Hirano, Tomoyuki; Ohno, Keiichi; Iwamoto, Hayato; Saito, Masaki; Liu, Yefan; Hiblot, Gaspard; Vanstreels, Kris; Gonzalez, Mario; Velenis, Dimitrios; Beyer, Gerald; Van der Plas, Geert; De Wolf, Ingrid; Beyne, Eric (2019)
    • Improvement of InGaAs interface properties by H2O-based La2O3 

      Suzuki, Rena; Yoshida, Shinichi; Sasaki, Toru; Oshiyama, Itaru; Hirano, Tomoyuki; Saito, Masaki; Ohno, Keiichi; Iwamoto, Hayato; Franco, Jacopo; Putcha, Vamsi; Cott, Daire; Sioncke, Sonja; Vais, Abhitosh; Collaert, Nadine (2018-12)