Browsing by author "Rauch, Stewart E. III"

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Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approach

Sharma, Prateek; Tyaginov, Stanislav; Rauch, Stewart E. III; Franco, Jacopo; Makarov, Alexander; Vexler, Mikhail I.; Kaczer, Ben; Grasser, Tibor (2017)