Authors

Sharma, Prateek; Tyaginov, Stanislav; Rauch, Stewart E. III; Franco, Jacopo; Makarov, Alexander; Vexler, Mikhail I.; Kaczer, Ben; Grasser, Tibor

ISSN

0741-3106

Issue

2

Journal

IEEE Electron Device Letters

Volume

38

Title

Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approach

Publication type

Journal article

Embargo date

9999-12-31