Browsing by author "McDonnell, Stephen"
Now showing items 1-1 of 1
-
Low voltage stress-induced leakage current in 1.4 - 2.1 nm SiON and HfSiON gate dielectric layers
O'Connor, Robert; McDonnell, Stephen; Hughes, Greg; Degraeve, Robin; Kauerauf, Thomas (2005-08)