Browsing by author "Dou, Chunmeng"
Now showing items 1-3 of 3
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Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Dou, Chunmeng; Lin, Dennis; Vais, Abhitosh; Ivanov, Tsvetan; Chen, Han-Ping; Martens, Koen; Kakushima, Kuniyuki; Iwai, Hiroshi; Taur, Yuan; Thean, Aaron; Groeseneken, Guido (2014) -
On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
Vais, Abhitosh; Lin, Dennis; Dou, Chunmeng; Yuan, Yu; Martens, Koen; Ivanov, Tsvetan; Collaert, Nadine; De Meyer, Kristin; Thean, Aaron; Taur, Yuan (2013) -
Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
Vais, Abhitosh; Lin, Dennis; Dou, Chunmeng; Martens, Koen; Ivanov, Tsvetan; Xie, Qi; Tang, Fu; Givens, Michael; Maes, Jan; Collaert, Nadine; Raskin, Jean-Pierre; De Meyer, Kristin; Thean, Aaron (2015)