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On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
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1855 since deposited on 2021-10-21
2last month
Acq. date: 2026-02-28
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Statistics
Views
1855 since deposited on 2021-10-21
2last month
Acq. date: 2026-02-28
Citations