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On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps

Date

2013
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dc.contributor.authorVais, Abhitosh
dc.contributor.authorLin, Dennis
dc.contributor.authorDou, Chunmeng
dc.contributor.authorYuan, Yu
dc.contributor.authorMartens, Koen
dc.contributor.authorIvanov, Tsvetan
dc.contributor.authorCollaert, Nadine
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorThean, Aaron
dc.contributor.authorTaur, Yuan
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorIvanov, Tsvetan
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecIvanov, Tsvetan::0000-0003-3407-2742
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-21T13:07:39Z
dc.date.available2021-10-21T13:07:39Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23216
dc.source.conference44th IEEE Semiconductor Interface Specialists Conference
dc.source.conferencedate5/12/2013
dc.source.conferencelocationArlington, VA USA
dc.title

On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps

dc.typeMeeting abstract
dspace.entity.typePublication
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