Browsing by author "Streiter, I."
Now showing items 1-6 of 6
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Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-K SiO2 xerogel films
Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2002) -
Comparison of techniques to characterize the density, porosity and elastic modules of porous low-k SiO2 xerogel films
Murray, C.; Flannery, C.; Streiter, I.; Schulz, S. E.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Himcinschi, C.; Friedrich, M.; Zahn, D. R. T.; Gessner, T. (2001) -
Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane
Himcinschi, C.; Friedrich, M.; Frühauf, S.; Streiter, I.; Schulz, S.E.; Gessner, T.; Baklanov, Mikhaïl; Moguilnikov, Konstantin; Zahn, D.R.T. (2002) -
Ellipsometric study of the change in the porosity of silica xerogels after surface chemical modification with hexamethyldisilizane
Himcinschi, C.; Friedrich, M.; Frühauf, S.; Streiter, I.; Schulz, S. E.; Gessner, T.; Baklanov, Mikhaïl; Mogilnikov, K. P.; Zahn, D. R. T. (2001) -
Thin-film aerogel porosity and stiffness characterised by Surface Acoustic Wave Spectroscopy
Flannery, C. M.; Murray, C.; Baklanov, Mikhaïl; Streiter, I.; Schulz, S. E. (2001) -
Thin-film aerogel porosity and stiffness characterized by surface acoustic wave spectroscopy
Flannery, C.M.; Murray, C.; Baklanov, Mikhaïl; Streiter, I.; Schultz, S.E> (2002)