Browsing by author "Spiewak, P."
Now showing items 1-2 of 2
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A comparison of intrinsic point defect properties in Si and Ge
Vanhellemont, J.; Spiewak, P.; Sueoka, K.; Simoen, Eddy; Romandic, I. (2008) -
On the characterisation of grown-in defects in Czocharski-grown Si and Ge
Vanhellemont, Jan; Van Steenbergen, Jan; Holsteyns, Frank; Roussel, Philippe; Meuris, Marc; Mlynarczyk, K.; Spiewak, P.; Geens, Wim; Romandic, I. (2008)