A comparison of intrinsic point defect properties in Si and Ge

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Authors
Vanhellemont, J.; Spiewak, P.; Sueoka, K.; Simoen, Eddy; Romandic, I.
Conference
Doping Engineering for Front-End Processing
Title
A comparison of intrinsic point defect properties in Si and Ge
Publication type
Proceedings paper
Embargo date
9999-12-31
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