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A comparison of intrinsic point defect properties in Si and Ge
Publication:
A comparison of intrinsic point defect properties in Si and Ge
Date
2008
Proceedings Paper
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17112.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, J.
;
Spiewak, P.
;
Sueoka, K.
;
Simoen, Eddy
;
Romandic, I.
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1917
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1917
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations