Publication:

A comparison of intrinsic point defect properties in Si and Ge

Date

2008
Proceedings Paper
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dc.contributor.authorVanhellemont, J.
dc.contributor.authorSpiewak, P.
dc.contributor.authorSueoka, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRomandic, I.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T12:19:05Z
dc.date.available2021-10-17T12:19:05Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14720
dc.source.beginpage1070-E6-05
dc.source.conferenceDoping Engineering for Front-End Processing
dc.source.conferencedate24/03/2008
dc.source.conferencelocationSan Francisco, CA USA
dc.title

A comparison of intrinsic point defect properties in Si and Ge

dc.typeProceedings paper
dspace.entity.typePublication
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