Browsing by author "Snauwaert, Johan"
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Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tips
De Wolf, Peter; Snauwaert, Johan; Hellemans, L.; Clarysse, Trudo; Vandervorst, Wilfried; D'Olieslaeger, Marc; Quaeyhaegens, D. (1995) -
Minimizing the size of force-controlled point contacts on silicon for carrier profiling
Snauwaert, Johan; Blanc, N.; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1996) -
Nanoscale selective silicon nanowires surface functionalization for sensing applications
Armini, Silvia; Carli, Marta; Snauwaert, Johan; Cherman, Vladimir; De Wolf, Ingrid; Simons, Veerle; Maestre Caro, Arantxa; Moonens, Jos; Neutens, Pieter; Arstila, Kai; Ogi, J.; Oda, S.; Tsuchiya, Yoshi; Mizuta, Hiroshi (2010)